APA   Click to copy
Verma, A., Connaughton, S., & Stamenov, P. (2018). Multiple contacts investigation of single silicon nanowires with the active voltage contrast scanning electron microscopy technique. Measurement Science and Technology, 30, 017002. https://doi.org/10.1088/1361-6501/aaeab8

Chicago/Turabian   Click to copy
Verma, Akshara, Stephen Connaughton, and Plamen Stamenov. “Multiple Contacts Investigation of Single Silicon Nanowires with the Active Voltage Contrast Scanning Electron Microscopy Technique.” Measurement Science and Technology 30 (December 2018): 017002.

MLA   Click to copy
Verma, Akshara, et al. “Multiple Contacts Investigation of Single Silicon Nanowires with the Active Voltage Contrast Scanning Electron Microscopy Technique.” Measurement Science and Technology, vol. 30, IOP Publishing, Dec. 2018, p. 017002, doi:10.1088/1361-6501/aaeab8.

@article{verma2018a,
  title = {Multiple contacts investigation of single silicon nanowires with the active voltage contrast scanning electron microscopy technique},
  year = {2018},
  month = dec,
  journal = {Measurement Science and Technology},
  pages = {017002},
  publisher = {IOP Publishing},
  volume = {30},
  doi = {10.1088/1361-6501/aaeab8},
  author = {Verma, Akshara and Connaughton, Stephen and Stamenov, Plamen},
  month_numeric = {12}
}